Fluke 80 Series III Power Supply User Manual


 
Making Measurements
21
Testing Diodes
Caution
To avoid possible damage to the meter or to
the equipment under test, disconnect circuit
power and discharge all high-voltage
capacitors before testing diodes.
Use the diode test to check diodes, transistors, silicon
controlled rectifiers (SCRs), and other semiconductor
devices. This function tests a semiconductor junction by
sending a current through the junction, then measuring
the junction’s voltage drop. A good silicon junction drops
between 0.5 V and 0.8 V.
To test a diode out of a circuit, set up the meter as shown
in Figure 6. For forward-bias readings on any
semiconductor component, place the red test lead on the
component’s positive terminal and place the black lead
on the component’s negative terminal.
In a circuit, a good diode should still produce a forward-
bias reading of 0.5 V to 0.8 V; however, the reverse-bias
reading can vary depending on the resistance of other
pathways between the probe tips.
MIN MAX RANGE HOLD
H
HzREL
mA
A
mV
V
V
OFF
!
!
A
COM
V
mA µA
1000V MAX
400mA MAX
FUSED
10A MAX
FUSED
PEAK MIN MAX
µA
CAT II
+
Typical
Reading
MIN MAX RANGE HOLD
H
HzREL
mA
A
mV
V
V
OFF
!
!
A
COM
V
mA µA
1000V MAX
400mA MAX
FUSED
10A MAX
FUSED
PEAK MIN MAX
µA
CAT II
+
Forward Bias
Reverse Bias
4 1/2 DIGITS
1 Seconds
87
TRUE RMS MULTIMETER
III
4 1/2 DIGITS
1 Seconds
87
TRUE RMS MULTIMETER
III
iy9f.eps
Figure 6. Testing a Diode