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Toshiba Corporation Digital Media Network Company
Page 117 of 157
© 2005, Copyright TOSHIBA Corporation All Rights Reserved
10.8.42.6.3.4 Device error count
The device error count field is defined in 10.8.42.6.2.5.
10.8.42.6.3.5 Data structure checksum
The data structure checksum is defined in 10.8.42.6.2.6.
10.8.42.6.4 Self-test log sector
The following Table defines the 512 bytes that make up the SMART self-test log sector.
Self-test log data structure
Byte Descriptions
0-1 Self-test log data structure revision number
2-25 First descriptor entry
26-49 Second descriptor entry
..... ............
482-505 Twenty-first descriptor entry
506-507 Vendor specific
508 Self-test index
509-510 Reserved
511 Data structure checksum
10.8.42.6.4.1 Self-test log data structure revision number
The value of the self-test log data structure revision number is set to 0001h.