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Chapter 1 23
Item (NB Cont.) Features
• The RS880M complies with all relevant Windows Logo Program
(WLP) requirements from Microsoft for WHQL certification.
Test Capability Features
The RS880M has a variety of test modes and capabilities that provide a
very high fault coverage and low DPM (Defect Per Million) ratio:
• Full scan implementation on the digital core logic through ATPG
(Automatic Test Pattern Generation Vectors).
• Dedicated test logic for the on-chip custom memory macros to
provide complete coverage on these modules.
• A JTAG test mode to allow board level testing of neighboring
devices.
• An EXOR tree test mode on all the digital USB's to allow for proper
soldering verification at the board level.
• A VOH/VOL test mode on all digital USB¡¦s to allow for proper
verification of output high and output low values at the board level.
• Access to the analog modules to allow full evaluation and
characterization.
• IDDQ mode support to allow chip evaluation through current leakage
measurements.
• These test modes can be accessed through the settings on the
instruction register of the JTAG circuitry.
• Additional Features
• Integrated spread spectrum PLLs on the memory and LVDS
interface.