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CY62157CV30/33
Document #: 38-05014 Rev. *F Page 5 of 13
Capacitance
[7]
Parameter Description Test Conditions Max. Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= V
CC(typ.)
6pF
C
OUT
Output Capacitance 8 pF
AC Test Loads and Waveforms
V
CC
Typ
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
OUTPUT V
TH
Equivalent to: THÉVENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
Rise TIme: 1 V/ns Fall Time: 1 V/ns
Parameters 3.0V 3.3V Unit
R1 1.105 1.216 ΚΩ
R2 1.550 1.374 ΚΩ
R
TH
0.645 0.645 ΚΩ
V
TH
1.75 1.75 V
Data Retention Characteristics (Over the Operating Range)
Parameter Description Conditions Min. Typ.
[2]
Max. Unit
V
DR
V
CC
for Data Retention 1.5 V
I
CCDR
Data Retention Current V
CC
= 1.5V, CE
1
> V
CC
– 0.2V or
CE
2
< 0.2V,
V
IN
> V
CC
– 0.2V or V
IN
< 0.2V
Auto-A 4 20 µA
Auto-E
460µA
t
CDR
[8]
Chip Deselect to Data
Retention Time
0ns
t
R
[8]
Operation Recovery Time t
RC
ns
Data Retention Waveform
[9]
Notes:
8. Full Device AC operation requires linear V
CC
ramp from V
DR
to V
CC(min.)
> 100 µs or stable at V
CC(min.)
>100 µs.
9. BHE
.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.
V
CC(min.)
V
CC(min.)
t
CDR
V
DR
> 1.5 V
DATA RETENTION MODE
t
R
CE
1
or
V
CC
BHE.BLE
CE
2
or
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