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CY7C1019CV33
Document #: 38-05130 Rev. *F Page 3 of 10
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on V
CC
to Relative GND
[2]
.... –0.5V to +4.6V
DC Voltage Applied to Outputs
in High-Z State
[2]
....................................–0.5V to V
CC
+ 0.5V
DC Input Voltage
[2]
.................................–0.5V to V
CC
+ 0.5V
Current into Outputs (LOW).........................................20 mA
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Latch-up Current......................................................>200 mA
Operating Range
Range
Ambient
Temperature V
CC
Commercial 0°C to +70°C 3.3V ± 10%
Industrial –40°C to +85°C 3.3V ± 10%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions
–10 –12 –15
UnitMin. Max. Min. Max. Min. Max.
V
OH
Output HIGH Voltage V
CC
= Min.,
I
OH
= –4.0 mA
2.4 2.4 2.4 V
V
OL
Output LOW Voltage V
CC
= Min.,
I
OL
= 8.0 mA
0.4 0.4 0.4 V
V
IH
Input HIGH Voltage 2.0 V
CC
+ 0.3 2.0 V
CC
+ 0.3 2.0 V
CC
+ 0.3 V
V
IL
Input LOW Voltage
[2]
–0.3 0.8 –0.3 0.8 –0.3 0.8 V
I
IX
Input Leakage Current GND < V
I
< V
CC
–1 +1 –1 +1 –1 +1 µA
I
OZ
Output Leakage
Current
GND < V
I
< V
CC
,
Output Disabled
–1 +1 –1 +1 –1 +1 µA
I
CC
V
CC
Operating
Supply Current
V
CC
= Max.,
I
OUT
= 0 mA,
f = f
MAX
= 1/t
RC
80 75 70 mA
I
SB1
Automatic CE
Power-down Current
—TTL Inputs
Max. V
CC
, CE > V
IH
V
IN
> V
IH
or
V
IN
< V
IL
, f = f
MAX
15 15 15 mA
I
SB2
Automatic CE
Power-down Current
—CMOS Inputs
Max. V
CC
,
CE
> V
CC
– 0.3V,
V
IN
> V
CC
– 0.3V,
or V
IN
< 0.3V, f = 0
555mA
Capacitance
[3]
Parameter Description Test Conditions Max. Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
8pF
C
OUT
Output Capacitance 8 pF
Notes:
2. V
IL
(min.) = –2.0V for pulse durations of less than 20 ns.
3. Tested initially and after any design or process changes that may affect these parameters.
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