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CY7C1292DV18
CY7C1294DV18
Document #: 001-00350 Rev. *A Page 18 of 23
Note:
22.Unless otherwise noted, test conditions assume signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V, RQ = 250Ω, V
DDQ
= 1.5V, input
pulse levels of 0.25V to 1.25V, and output loading of the specified I
OL
/I
OH
and load capacitance shown in (a) of AC Test Loads.
Thermal Resistance
[21]
Parameter Description Test Conditions 165 FBGA Unit
Θ
JA
Thermal Resistance (Junction to Ambient) Test conditions follow standard test
methods and procedures for measuring
thermal impedance, per EIA/JESD51.
28.51 °C/W
Θ
JC
Thermal Resistance (Junction to Case) 5.91 °C/W
AC Test Loads and Waveforms
1.25V
0.25V
R = 50Ω
5pF
ALL INPUT PULSES
Device
R
L
= 50Ω
Z
0
= 50Ω
V
REF
= 0.75V
V
REF
= 0.75V
[22]
0.75V
Under
Test
0.75V
Device
Under
Tes t
OUTPUT
0.75V
V
REF
V
REF
OUTPUT
ZQ
ZQ
(a)
Slew Rate = 2 V/ns
RQ =
250
Ω
(b)
RQ =
250
Ω
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