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CY7C1380C
CY7C1382C
Document #: 38-05237 Rev. *D Page 17 of 36
Note that since the PRELOAD part of the command is not
implemented, putting the TAP to the Update-DR state while
performing a SAMPLE/PRELOAD instruction will have the
same effect as the Pause-DR command.
BYPASS
When the BYPASS instruction is loaded in the instruction
register and the TAP is placed in a Shift-DR state, the bypass
register is placed between the TDI and TDO balls. The
advantage of the BYPASS instruction is that it shortens the
boundary scan path when multiple devices are connected
together on a board.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
TAP Timing
TAP AC Switching Characteristics Over the operating Range
[9, 10]
Parameter Symbol Min Max Units
Clock
TCK Clock Cycle Time t
TCYC
100 ns
TCK Clock Frequency t
TF
10 MHz
TCK Clock HIGH time t
TH
40 ns
TCK Clock LOW time t
TL
40 ns
Output Times
TCK Clock LOW to TDO Valid t
TDOV
20 ns
TCK Clock LOW to TDO Invalid t
TDOX
0ns
Setup Times
TMS Set-Up to TCK Clock Rise t
TMSS
10 ns
TDI Set-Up to TCK Clock Rise t
TDIS
10 ns
Capture Set-Up to TCK Rise t
CS
10
Hold Times
TMS hold after TCK Clock Rise t
TMSH
10 ns
TDI Hold after Clock Rise t
TDIH
10 ns
Capture Hold after Clock Rise t
CH
10 ns
Notes:
9.
t
CS and
t
CH refer to the setup and hold time requirements of latching data from the boundary scan register.
10. Test conditions are specified using the load in TAP AC test Conditions. t
R
/t
F
= 1ns.
t
TL
Test Clock
(TCK)
123456
T
est Mode Select
(TMS)
t
TH
Test Data-Out
(TDO)
t
CYC
Test Data-In
(TDI)
t
TMSH
t
TMSS
t
TDIH
t
TDIS
t
TDOX
t
TDOV
DON’T CARE UNDEFINED
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