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Intel
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X18-M/X25-M SATA SSD
Intel
®
X18-M/X25-M SATA Solid State Drive
Advance Product Manual July 2008
10 Order Number: 319765-002US
Intel
®
X18-M/X25-M SATA SSD
3.4.5 Electromagnetic Immunity
Electromagnetic Immunity tests assume the SSD is properly installed in the
representative host system. The drive will operate properly without errors or
degradation in performance when subjected to radio frequency (RF) environments
defined in the following table:
Notes:
1. Performance Criteria A = The device shall continue to operate as intended, i.e., normal unit operation with no
degradation of performance.
2. Performance Criteria B = The device shall continue to operate as intended after completion of the test. However, during
the test, some degradation of performance is allowed as long as there is no data loss operator intervention to restore
device function.
3. Performance Criteria C = temporary loss of function is allowed. Operator intervention is acceptable to restore device
function.
4. Contact electostatic discharge applied to drive enclosure.
3.5 Reliability
3.5.1 Nonrecoverable Read Errors
The nonrecoverable read error rate will not exceed one sector in the specified number
of bits read. In the extremely unlikely event of a nonrecoverable read error, the drive
will report it as a read failure to the host; the sector in error is considered corrupt and
is not returned to the host.
Table 10. Radio Frequency Specifications
Test Description
Performance
Criteria
Reference Standard
Electrostatic discharge Contact, HCP, VCP: ±8kV; Air: ± 15 kV B EN 61000-4-2: 95
Radiated RF immunity
80 to 1,000 MHz, 3 V/m,
80% AM with 1 kHz sine
900 MHz, 3 V/m, 50% pulse modulation at
200 Hz
A
EN 61000-4-3: 96
ENV 50204: 95
Electrical fast transient
± 1 kV on AC mains, ± 0.5 kV on external
I/O
B EN 61000-4-4: 95
Surge immunity
± 1 kV differential, ± 2 kV common, AC
mains
B EN 61000-4-5: 95
Conducted RF immunity
150 kHz to 80 MHz, 3 Vrms, 80% AM with 1
kHz sine
A EN 61000-4-6: 97
Voltage dips, interrupts
0% open, 5 seconds
0% short, 5 seconds
40%, 0.10 seconds
70%, 0.01 seconds
C
C
C
B
EN 61000-4-11: 94
Table 11. Reliability Specifications
Parameter Value
Nonrecoverable read errors 1 sector in 10
15
bits read, max
Mean Time between Failure (MTBF) 1,200,000 hours
Power On/Off Cycles 50,000 cycles
Minimum Useful Life 5 years