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SV35 Series SATA Product Manual, Rev. B
19
2.12 Reliability
2.13 Agency certification
2.13.1 Safety certification
The drives are recognized in accordance with UL 1950 and CSA C22.2 (950) and meet all applicable sections
of IEC950 and EN 60950 as tested by TUV North America.
2.13.2 Electromagnetic compatibility
Hard drives that display the CE mark comply with the European Union (EU) requirements specified in the Elec-
tromagnetic Compatibility Directive (89/336/EEC). Testing is performed to the levels specified by the product
standards for Information Technology Equipment (ITE). Emission levels are defined by EN 55022, Class B and
the immunity levels are defined by EN 55024.
Seagate uses an independent laboratory to confirm compliance with the EC directives specified in the previous
paragraph. Drives are tested in representative end-user systems. Although CE-marked Seagate drives comply
with the directives when used in the test systems, we cannot guarantee that all systems will comply with the
directives. The drive is designed for operation inside a properly designed enclosure, with properly shielded I/O
cable (if necessary) and terminators on all unused I/O ports. Computer manufacturers and system integrators
should confirm EMC compliance and provide CE marking for their products.
Korean RRL
If these drives have the Korea Ministry of Information and Communication (MIC) logo, they comply with para-
graph 1 of Article 11 of the Electromagnetic Compatibility control Regulation and meet the Electromagnetic
Compatibility (EMC) Framework requirements of the Radio Research Laboratory (RRL) Ministry of Information
and Communication Republic of Korea.
These drives have been tested and comply with the Electromagnetic Interference/Electromagnetic Susceptibil-
ity (EMI/EMS) for Class B products. Drives are tested in a representative, end-user system by a Korean-recog-
nized lab.
• EUT name (model numbers): ST3500641SV, ST3250824SV, and ST3160812SV.
• Certificate numbers: E-H011-05-3453 (B)
• Trade name or applicant: Seagate Technology
• Manufacturing date: March 2006
• Manufacturer/nationality: Singapore and China
Nonrecoverable read errors 1 per 10
14
bits read, max
Annualized Failure Rate (AFR) <1% (nominal power, 8760 power on hours, 25°C ambient temperature)
Contact start-stop cycles 50,000 cycles
(at nominal voltage and temperature, with 60 cycles per hour and a 50% duty cycle)
Preventive maintenance None required