Acer 521 Laptop User Manual


 
20 Chapter 1
Item (NB Cont.) Specification
Features The RS880M complies with all relevant Windows Logo Program
(WLP) requirements from Microsoft for WHQL certification.
Test Capability Features
The RS880M has a variety of test modes and capabilities that provide a
very high fault coverage and low DPM (Defect Per Million) ratio:
Full scan implementation on the digital core logic through ATPG
(Automatic Test Pattern Generation Vectors).
Dedicated test logic for the on-chip custom memory macros to
provide complete coverage on these modules.
A JTAG test mode to allow board level testing of neighboring
devices.
An EXOR tree test mode on all the digital I/O's to allow for proper
soldering verification at the board level.
A VOH/VOL test mode on all digital I/O¡¦s to allow for proper
verification of output high and output low values at the board level.
Access to the analog modules to allow full evaluation and
characterization.
IDDQ mode support to allow chip evaluation through current leakage
measurements.
These test modes can be accessed through the settings on the
instruction register of the JTAG circuitry.
Additional Features
Integrated spread spectrum PLLs on the memory and LVDS
interface.