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AU OPTRONICS CORPORATION
Product Specification
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M240HW01 V2
8.0 Reliability Test
Environment test conditions are listed as following table.
Items Required Condition
Note
Temperature Humidity Bias (THB) Ta= 50 , 80%RH, 300hours
High Temperature Operation (HTO) Ta= 50 , 50%RH, 300hours
Low Temperature Operation (LTO) Ta= 0 , 300hours
High Temperature Storage (HTS) Ta= 60 , 300hours
Low Temperature Storage (LTS) Ta= -20 , 300hours
Vibration Test
(Non-operation)
Acceleration: 1.5 Grms
Wave: Random
Frequency: 10 - 200 Hz
Duration: 30 Minutes each Axis (X, Y, Z)
Shock Test
(Non-operation)
Acceleration: 50 G
Wave: Half-sine
Active Time: 20 ms
Direction: X, Y, Z (one time for each Axis)
Drop Test Height: 46 cm, package test
Thermal Shock Test (TST) -20 /30min, 60 /30min, 100 cycles
1
On/Off Test On/10sec, Off/10sec, 30,000 cycles
Contact Discharge: ± 8KV, 150pF(330Ω ) 1sec,
15 points, 25 times/ point.
ESD (Electro Static Discharge)
Air Discharge: ± 15KV, 150pF(330Ω ) 1sec
15 points, 25 times/ point.
2
Altitude Test
Operation:10,000 ft
Non-Operation:30,000 ft
Note 1: The TFT-LCD module will not sustain damage after being subjected to 100 cycles of rapid
temperature change. A cycle of rapid temperature change consists of varying the temperature from
-2 to 6 , and back again. Power is not applied during the test. After temperature cycling, the
unit is placed in normal room ambient for at least 4 hours before power on.
Note 2: EN61000-4-2, ESD class B: Certain performance degradation allowed
No data lost
Self-recoverable
No hardware failures.