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IN-8 C141-E203-01EN
test span ...................................................5-65
theory of device operation .........................4-1
total number of drive error.......................5-62
track-following operation ........................4-17
transfer rate, data .....................................4-11
transfer rate, high-speed.............................1-2
U
unload function........................................1-11
unrecoverable read error..........................1-11
user password ........................................5-104
using read segment buffer........................6-14
V
VCM current sense resister......................4-13
vibration.....................................................1-9
vibration specification ...............................1-9
Viterbi detection circuit...........................4-11
voice coil motor.........................................4-2
W
worst case attribute value.........................5-57
WRITE BUFFER.....................................5-84
write cache ....................................... 1-3, 6-18
write circuit ................................................4-9
WRITE DMA...........................................5-80
WRITE DMA EXT................................5-127
WRITE DMA FUA EXT.......................5-136
WRITE FP DMA QUEUED..................5-138
WRITE FP DMA QUEUED
command protocol..............................5-150
WRITE LOG EXT.................................5-131
WRITE LONG.........................................5-32
WRITE MULTIPLE ................................5-74
WRITE MULTIPLE EXT .....................5-130
WRITE MULTIPLE FUA EXT.............5-135
write precompensation...............................4-9
WRITE SECTOR (S) EXT....................5-126
WRITE SECTOR(S)................................5-30
WRITE VERIFY......................................5-34
write/read recovery ..................................4-16