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STM-0e/STM-1e test
and interfaces
Option A3R Page 8
STM-0e (52 Mb/s) and STM-1e
(155 Mb/s) electrical
interface: STM-0/STM-1
overhead access, thru mode
and pointer sequences ,
TU-12, TU-2, VC-3 and VC-4
mappings.
Optical
interfaces
Option UH1 Page 10
155 Mb/s (1310 nm).
Option 130 Page 10
622/155/52 Mb/s (1310 and
1550 nm), optical power
measurement.
Option 131 Page 10
622/155/52 Mb/s (1310 nm),
optical power measurement.
Option 0YH† Page 10
622/155/52 Mb/s binary (NRZ)
interfaces. Must also order
option 130 or 131.
Jitter, wander and slips
testing – generation
Option A3K Page 9
PDH and SDH jitter and
wander generation.
Option 140 Page 9
PDH and SDH jitter
generation.
Jitter, wander and slips
testing – measurement
Option UHN Page 9
PDH jitter measurement: 2, 8,
34 and 140 Mb/s.
Option A3L Page 9
STM-1e line and PDH jitter
measurement: 2, 8, 34, 140
and 155 Mb/s.
Option A3V Page 9
STM-1o, STM-1e line and PDH
jitter measurement: 2, 8, 34,
140 Mb/s and 155 Mb/s.
Option A3N Page 9
STM-4o, STM-1o, STM-1e line
and PDH jitter measurement:
2, 8, 34, 140 Mb/s, 155 Mb/s
and 622 Mb/s.
PDH/ATM cell test
and PDH interfaces
Option UKK Page 8
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJ Page 8
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKN Page 8
ATM cell: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ).
Option UH3† Page 9
Binary (NRZ) clock and data
plus external clock input.
Must also order option UKK,
UKJ or UKN.
Option UHC† Page 11
Three additional 2, 8, 34 and
140 Mb/s outputs. Must also
order option UKK, UKJ or
UKN.
Module interworking section
PDH/SDH and ATM cell layer supported configurations
PDH/DSn interfaces
Option 110 Page 8
Structured PDH: DS1, DS3,
E1, E3.
Option UKK Page 8
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJ Page 8
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKN Page 8
ATM cell: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ).
Option UH3† Page 9
Binary (NRZ) clock and data
plus external clock input.
Must also order option UKK,
UKJ, UKN or 110.
Jitter, wander and slips
testing – generation*
Option A3K Page 9
PDH, 155 Mb/s, 622 Mb/s
jitter and wander generation.
Option 140 Page 9
As option A3K, but without
wander generation.
Jitter, wander and slips
testing – measurement*
Option UHN Page 9
PDH jitter measurement.
Option A3L Page 9
155 Mb/s electrical and PDH
jitter measurement.
Option A3V Page 9
155 Mb/s optical, electrical
and PDH jitter measurement.
Option A3N Page 9
622 Mb/s and 155 Mb/s
optical, electrical and PDH
jitter measurement.
Dual standard SONET/SDH and DSn/PDH supported configurations
SONET/SDH
test and interfaces
Option 120 Page 8
STS-1/STM-0e (52 Mb/s) and
STS-3/STM-1e (155 Mb/s)
electrical interface:
Overhead access, thru mode
and pointer sequences.
VT1.5/TU-11, VT2/TU-12,
VT6/TU-2, VC-3/STS-1 SPE
and VC-4/STS-3c SPE
mappings.
Optical
interfaces
Option UH1 Page 10
155 Mb/s (1310 nm).
Option 130 Page 10
622/155/52 Mb/s optical
interface (1310 and
1550 nm), optical power
measurement.
Option 131 Page 10
622/155/52 Mb/s optical
interface (1310 nm), optical
power measurement.
Option 0YH† Page 10
622/155/52 Mb/s binary
(NRZ) interfaces. Must also
order option 130 or 131.
The following three tables indicate which modules are capable of networking with
each other. Choose one from each category (if required)†