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Card and Service Configuration 6-53
Bit Error Rate Testing Through an MGX-SRM-3T3
Pattern Test Options
The pattern test options consist of the device to loop and the pattern. This section lists the device
options and patterns that appear in the menus. Refer to the preceding tables as needed. The device to
loop options identify the type of device that participates in the test:
• noLatch is a device that does not latch the data. It can be a:
— Non-latching office channel unit (OCU) that consists of one device
— Non-latching OCU that consists of a chain of devices
— Non-latching channel service unit (CSU)
— Non-latching data service unit (DSU)
• Latch is a device that can latch the data and can be a:
— Latching DS0-DP drop device
— Latching DS0-DP line device
— Latching office channel unit (OCU)
— Latching channel service unit (CSU)
— Latching data service unit (DSU)
— Latching HL96 device
• in-band/ESF
• v54 is a polynomial loopback
• metallic is a local loopback within the service module and does not involve an external device
The available patterns are:
1 All 0s
2 All 1s
3 Alternating 1-0 pattern
4 Double 1-0 pattern
5 2
15
-1 pattern
6 2
20
-1 pattern
7 2
20
-1 QRSS pattern
8 2
23
-1 pattern
9 1 in 8 pattern
10 3 in 24 pattern
11 DDS-1 pattern
12 DDS-2 pattern
13 DDS-3 pattern
14 DDS-4 pattern
15 DDS-5 pattern
16 2
9
pattern
17 2
11
pattern