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CY7C1330AV25
CY7C1332AV25
Document No: 001-07844 Rev. *A Page 14 of 19
AC Test Loads and Waveforms
Notes:
17.Tested initially and after any design or process change that may affect these parameters.
18.Unless otherwise noted, test conditions assume signal transition time of 2 V/ns, timing reference levels of 0.75V, V
REF
= 0.75V, RQ = 250Ω, V
DDQ
= 1.5V, input
pulse levels of 0.25V to 1.25V, and output loading of the specified I
OL
/I
OH
and load capacitance shown in (a) of AC Test Loads.
Capacitance
[17]
Parameter Description Test Conditions Max. Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
DD
= 2.5V
V
DDQ
= 1.5V
5pF
C
CLK
Clock Input Capacitance 6 pF
C
I/O
Input/Output Capacitance 7 pF
Thermal Resistance
[17]
Parameter Description Test Conditions BGA Typ. Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Still Air, soldered on a 4.25 x 1.125 inch, 4-layer printed
circuit board
19.7 °C/W
Θ
JC
Thermal Resistance
(Junction to Case)
6.0 °C/W
1.25V
0.25V
R = 50Ω
5pF
ALL INPUT PULSES
Device
R
L
= 50Ω
Z
0
= 50Ω
V
REF
= 0.75V
V
REF
= 0.75V
[18]
0.75V
Under
Test
0.75V
Device
Under
Test
OUTPUT
0.75V
V
REF
V
REF
OUTPUT
ZQ
ZQ
(a)
Slew Rate = 2 V/ns
RQ =
250
Ω
(b)
RQ =
250
Ω
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