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JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE
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Introduction
he JEOL JSM-6060LV is a state-of-the-art scanning electron microscope that features
a low vacuum for observation of non-conductive specimens, a fully automated electron
gun, a backscattered electron detector for atomic number contrast imaging, fully
integrated digital control, motorized x-y stage, and a NORAN System 6 elemental
analysis system (see separate operating instructions for the NORAN system). Best of all, the
JEOL JSM-6060LV scanning electron microscope is user-friendly and easy to operate.
Safety
The scanning electron microscope is a relatively safe instrument.. You can do much more
damage to it than it can do to you. When the electron beam is turned on, some x-rays are
produced as a result of electron beam interaction with the sample, but these x-rays are of relatively
low energy and do not escape the sample chamber. The instrument also produces some radio
frequency energy.
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