Fujitsu MBA3300RC Computer Drive User Manual


 
Disk Media Management
404 C141-C013
7.5 Drive Self-Test (DST)
7.5.1 Overview
This function supports two types of self-tests based on the specification in the
"SELF-TEST CODE" field of the SEND DIAGNOSTICS command as follows:
Short self-test
Extended self-test
A short self-test is conducted to quickly verify whether the HDD contains a
defect, whereas an extended self-test is a more comprehensive test conducted by
the HDD without INIT intervention.
A short self-test consists of one or more segments, and is completed within two
minutes. An extended self-test consists of one or more segments, and the testing
time is not limited.
The test segments that comprise self-tests are as shown below. These segments
will be conducted in ascending order of the numbers assigned to them.
a. Buffer RAM test
b. Flash ROM test
c. Pre-SMART test
d. Low Level Format test
e. Data compare test
f. Random read test
g. Sequential read test
h. SMART test
What is performed during a given test segment is the same regardless of whether
the test is a short self-test or extended self-test. The time required to complete an
extended self-test is reported in the "Extended Self-Test Completion Time" field
on the control mode page (Mode Page x0A).