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Table 5.22 Selective self-test log data structure
Byte Item
00h, 01h Data Structure Revision Number
02h...09h Starting LBA
0Ah...11h
Test Span 1
Ending LBA
12h...19h Starting LBA
1Ah...21h
Test Span 2
Ending LBA
22h...29h Starting LBA
2Ah...31h
Test Span 3
Ending LBA
32h...39h Starting LBA
3Ah...41h
Test Span 4
Ending LBA
42h...49h Starting LBA
4Ah...51h
Test Span 5
Ending LBA
52h...151h Reserved
152h...1EBh Vender Unique
1Ech...1F3h Current LBA under test
1F4h...1F5h Current Span under test
1F6h...1F7h Feature Flags
1F8h Offline Execution Flag
1F9h Selective Offline Scan Number
1FAh, 1FBh
Vender Unique
Reserved
1FCh, 1FDh Selective Self-test pending time [min]
1FEh, 1FFh Checksum
• Test Span
Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.
• Current LBA under test
As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.