8086
ABSOLUTE MAXIMUM RATINGS
Ambient Temperature Under Bias 0
Cto70
C
Storage Temperature
b
65
Cto
a
150
C
Voltage on Any Pin with
Respect to Ground
b
10V to
a
7V
Power Dissipation25W
NOTICE This is a production data sheet The specifi-
cations are subject to change without notice
WARNING Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage
These are stress ratings only Operation beyond the
‘‘Operating Conditions’’ is not recommended and ex-
tended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability
DC CHARACTERISTICS (8086 T
A
e
0
Cto70
C V
CC
e
5V
g
10%)
(8086-1 T
A
e
0
Cto70
C V
CC
e
5V
g
5%)
(8086-2 T
A
e
0
Cto70
C V
CC
e
5V
g
5%)
Symbol Parameter Min Max Units Test Conditions
V
IL
Input Low Voltage
b
05
a
08 V (Note 1)
V
IH
Input High Voltage 20 V
CC
a
05 V (Notes 1 2)
V
OL
Output Low Voltage 045 V I
OL
e
25 mA
V
OH
Output High Voltage 24 V I
OH
eb
400 mA
I
CC
Power Supply Current 8086 340
8086-1 360 mA T
A
e
25
C
8086-2 350
I
LI
Input Leakage Current
g
10 mA0V
s
V
IN
s
V
CC
(Note 3)
I
LO
Output Leakage Current
g
10 mA 045V
s
V
OUT
s
V
CC
V
CL
Clock Input Low Voltage
b
05
a
06 V
V
CH
Clock Input High Voltage 39 V
CC
a
10 V
C
IN
Capacitance of Input Buffer 15 pF fc
e
1 MHz
(All input except
AD
0
–AD
15
RQGT)
C
IO
Capacitance of IO Buffer 15 pF fc
e
1 MHz
(AD
0
–AD
15
RQGT)
NOTES
1 V
IL
tested with MNMX Pin
e
0V V
IH
tested with MNMX Pin
e
5V MNMX Pin is a Strap Pin
2 Not applicable to RQ
GT0 and RQGT1 (Pins 30 and 31)
3 HOLD and HLDA I
LI
min
e
30 mA max
e
500 mA
14