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61221002L2-5B C-1
This appendix describes the testing functionality available for the ADTRAN H2TU-C card via the MTAU unit.
For a complete description of the MTAU unit refer to Alcatel document Common Equipment Unit Descriptions,
OSP 363-405-250.
NOTE
The functionality of the SPLIT and MON features detailed in this document supercedes that shown in the OSP
363-405-250.
INITIATING MTAU TEST ACCESS
CONN-JACK-T1
The Connect T1 Jack command connects a T1 or HDSL facility to the MTAU via the channel bank test bus.
Input Format: CONN-JACK-T1:<TID>:<AID>:<CTAG>::<MD>;
AID = Access ID of the unit to be connected to the MTAU
MD = Mode (SPLIT or MON)
Example: CONN-JACK-T1::COT-1-15:::SPLIT;
NOTE
To use SPLIT mode, a facility must be out of service for maintenance or out of service for memory
administration.
Diagrams of the functionality of the two modes are shown below:
Appendix C
Metallic Test Access Unit (MTAU) Testing Capabilities
HDSL2
Transceiver
AHDSL2
Test
LIU
HDSL2 Loop
TAE, RAE
EQPT jacks on the MTAU Facility jack on the MTAU
TBE, RBE
Alcatel
Network
Equip
SPLIT Mode
Used to test toward the network equipment and to test the loops
Tip
A-3
Ring1
A-4
TAF RAF
Figure C-1. SPLIT Mode