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Disk Media Management
408 C141-C013
b. Flash ROM test
This test segment conducts a sumcheck test on each block of program code
contained in flash ROM.
If a sumcheck error is detected on one block, Hardware Error [=4]/F/W
Header/Check SUM Error [=40-84] is reported on the self-test result log
page.
c. Pre-SMART test
This test segment uses the failure prediction function (SMART) to determine
whether the target device has detected a failure prediction reporting
condition. If the device has detected a failure prediction reporting condition,
Unit Attention [=06]/Failure Prediction Threshold Exceeded [=5D/nn] is
reported on the self-test result log page regardless of the reporting method
specified by failure prediction reporting condition "MRIE" and the settings of
the DESCPT and EWASC bits.
The failure prediction items that may be reported here are as follows:
− Test Mode
− Device temperature
− Read error rate
− Seek error rate
− Number of remaining alternate sectors
− Spin-up time
− G-list update frequency
− Write error rate
d. Low Level Format test
This test segment determines whether the device to be tested is logically
accessible. If this test detects one of the events below, which lead to the
conclusion that formatting is required, Medium Error [=03]/Medium Format
Corrupted [31/00] is reported on the self-test result log page.
− The number of data blocks in Mode Parameter has been changed to a
value that exceeds the maximum value that can be specified, based on the
assumption of the current number of cylinders.
− The number of alternate sectors per zone in Mode Parameter has been
changed.
− The data block length in Mode Parameter has been changed.