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CY14B256K
Document Number: 001-06431 Rev. *H Page 16 of 28
Data Retention and Endurance
Parameter Description Min Unit
DATA
R
Data Retention 20 Years
NV
C
Nonvolatile STORE Operations 200 K
Capacitance
These parameters are guaranteed but not tested.
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= 0 to 3.0 V
7pF
C
OUT
Output Capacitance 7 pF
Thermal Resistance
These parameters are guaranteed but not tested.
Parameter Description Test Conditions 48-SSOP Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA / JESD51.
32.9 °C/W
Θ
JC
Thermal Resistance
(Junction to Case)
25.56 °C/W
Figure 7. AC Test Loads
AC Test Conditions
3.0V
Output
5 pF
R1 577Ω
R2
789Ω
3.0V
Output
30 pF
R1 577Ω
R2
789Ω
For Tri-state Specs
Input Pulse Levels..................................................0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <
5 ns
Input and Output Timing Reference Levels................... 1.5 V
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