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©2002 Fairchild Semiconductor Corporation Application Note 7511 Rev. A1
FIGURE 17. USE THIS LATCHING-CURRENT TESTER TO TEST IGTS NONDESTRUCTIVELY. Q
1
’S BASE-DRIVE PULSE WIDTH IS GREAT-
ER THAN THAT OF THE IGT’S GATE DRIVE, SO THE IGT UNDER TEST IS SWITCHED THROUGH Q
1
WHEN REVERSE-BIAS
LATCH-UP OCCURS.
PULSE
GENERATOR
PULSE
GENERATOR
TRIGGER
1000pF
A114A
A114A
1k
100
100
50
10
D38H1
D44D6
Q
1
= D66EV7
Q
2
= DUT D94FQ4
DS0026x2
5V
1N914
10V
PE-63385
A114A
15V
D66EV7
Q
1
R
GE
1-10k
V
CE
A139M
10
V
CC
V
CLAMP
(400V MAX)
0.02µF
10µF
A139P
L = 100µH
2k
Q
2
Application Note 7511