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Travelstar 5K160 (SATA) Hard Disk Drive Specification
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S.M.A.R.T. Execute Off-line Immediate(Subcommand D4h) or automatically if the off-line read
scanning feature is disabled.
A value of F8h written by the host into the device’s Sector Count register before issuing this
subcommand shall cause the automatic Off-line data collection feature to be enabled.
A value of F9 written by the host into the device’s Sector Count register before issuing this
subcommand shall cause the off-line read scanning feature to be enabled. The Device perform the
off-line read scanning at the off-line data collection activities which is initiated by the S.M.A.R.T.
Execute Off-line Immediate(Subcommand D4h) even if the automatic off-line feature is disabled.
Any other non-zero value written by the host into this register before issuing this subcommand is
vender specific and will not change the current Automatic Off-Line Data Collection and Off-line
Read Scanning status, but device may respond with the error code specified in “S.M.A.R.T. Error
Codes” on Page 5.
14.40.2 Device Attributes Data Structure
The following defines the 512 bytes that make up the Attribute Value information. This data
structure is accessed by the host in its entirety using the S.M.A.R.T. Read Attribute Values
subcommand. All multi-byte fields shown in these data structures follow the ATA/ATAPI-6
specification for byte ordering, namely that the least significant byte occupies the lowest numbered
byte address location in the field.
Description Bytes Offset Format Value
Data Structure Revision Number 2 00h binary 0010h
1
st
Device Attribute 12 02h (*1) (*2)
... ..
... ..
30
th
Device Attribute 12 15Eh (*1) (*2)
Off-line data collection status 1 16Ah (*1) (*2)
Self-test execution status 1 16Bh (*1) (*2)
Total time in seconds to complete off-line data collection activity 2 16Ch (*1) (*2)
Current segment pointer 1 16Eh (*1) (*2)
Off-line data collection capability 1 16Fh (*1) 1Bh
S.M.A.R.T. capability 2 170h (*1) 0003h
S.M.A.R.T. device error logging capability 1 172h (*1) 01h
Self-test failure check point 1 173h (*1) (*2)
Short self-test completion time in minutes 1 174h (*1) (*2)
Extended self-test completion time in minutes 1 175h (*1) (*2)
Reserved 12 176h (*3)
Vendor specific 125 182h (*3)
Data structure checksum 1 1FFh (*1) (*2)
512
(*1) - See following definitions
(*2) - Value varied by actual operating condition
(*3) - Filled with 00h
Figure 83 Device Attribute Data Structure
14.40.2.1 Data Structure Revision Number
The Data Structure Revision Number identifies which version of this data structure is implemented
by the device. This revision number will be set to 0005h. This revision number identifies both the
Attribute Value and Attribute Threshold Data structures.