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Toshiba Corporation Digital Media Network Company
Page 120 of 157
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10.8.42.6.5.4 Current span under test
The Current span under test field shall be written with a value of zero by the host. As the self-test progresses,
the device shall modify this value to contain the test span number of the current span being tested. If an off-line
scan between test spans is selected, a value greater then five is placed in this field during the off-line scan.
When the self-test including the off-line scan between test spans has been completed, a zero value is placed in
this field.
10.8.42.6.5.5 Feature flags
The Feature flags define the features of Selective self-test to be executed (see following table).
Selective self-test feature flags
Bit Description
0 Vendor specific
1 When set to one, perform off-line scan after selective test.
2 Vendor specific
3 When set to one, off-line scan after selective test is pending.
4 When set to one, off-line scan after selective test is active.
5-15 Reserved.
Bit (1) shall be written by the host and returned unmodified by the device. Bits (4:3) shall be written as zeros by
the host and the device shall modify them as the test progresses.
10.8.42.6.5.6 Selective self-test pending time
The selective self-test pending time is the time in minutes from power-on to the resumption of the off-line testing
if the pending bit is set. At the expiration of this time, sets the active bit to one, and resumes the off-line scan that
had begun before power-down.
10.8.42.6.5.7 Data structure checksum
The data structure checksum is the two's complement of the sum of the first 511 bytes in the data
structure. Each byte will be added with unsigned arithmetic, and overflow will be ignored. The sum of all
512 bytes is zero when the checksum is correct. The checksum is placed in byte 511.