Filter
Top Products
360050398
Toshiba Corporation Digital Media Network Company
Page 130 of 157
© 2005, Copyright TOSHIBA Corporation All Rights Reserved
10.8.43.3.3 Extended Self-test log descriptor entry
The content of the self-test descriptor entry is shown in the following table.
Extended Self-test log descriptor entry
Byte Descriptions
n Content of the LBA Low register.
n+1 Content of the self-test execution status byte.
n+2 Life timestamp (least significant byte).
n+3 Life timestamp (most significant byte).
n+4 Content of the self-test failure checkpoint byte.
n+5 Failing LBA (7:0).
n+6 Failing LBA (15:8).
n+7 Failing LBA (23:16).
n+8 Failing LBA (31:24).
n+9 Failing LBA (39:32).
n+10 Failing LBA (47:40).
n+1 - n+23 Vendor specific.
Content of the LBA Low register shall be the content of the LBA Low register when the nth self-test
subcommand was issued (see 10.8.42.5 ).
Content of the self-test execution status byte shall be the content of the self-test execution status byte when the
nth self-test was completed (see 10.8.42.5).
Life timestamp shall contain the power-on lifetime of the device in hours when the nth self-test subcommand
was completed.
Content of the self-test failure checkpoint byte may contain additional information about the self-test that failed.
The failing LBA shall be the LBA of the sector that caused the test to fail. If the device encountered more than
one failed sector during the test, this field shall indicate the LBA of the first failed sector encountered. If the test
passed or the test failed for some reason other than a failed sector, the value of this field is undefined.
10.8.43.3.4 Data structure checksum
The data structure checksum is the two's complement of the sum of the first 511 bytes in the data structure.
Each byte shall be added with unsigned arithmetic, and overflow shall be ignored. The sum of all 512 bytes is
zero when the checksum is correct. The checksum is placed in byte 511.