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Electrical Specifications
66 Datasheet
7.5.2 Die Voltage Validation
Core voltage (V
CC
) overshoot events at the processor must meet the specifications in
Table 7-12 when measured across the VCC_SENSE and VSS_VCC_SENSE lands.
Overshoot events that are < 10 ns in duration may be ignored. These measurements of
processor die level overshoot should be taken with a 100 MHz bandwidth limited
oscilloscope.
7.5.2.1 V
CC
Overshoot Specifications
The processor can tolerate short transient overshoot events where V
CC
exceeds the VID
voltage when transitioning from a high-to-low current load condition. This overshoot
cannot exceed VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot above
VID). These specifications apply to the processor die voltage as measured across the
VCC_SENSE and VSS_VCC_SENSE lands.
Notes:
1. V
OS_MAX
is the measured overshoot voltage.
2. T
OS_MAX
is the measured time duration above VccMAX(I1).
3. Istep: Load Release Current Step, for example, I2 to I1, where I2 > I1.
4. VccMAX(I1) = VID - I1*RLL + 15mV
Table 7-12. V
CC
Overshoot Specifications
Symbol Parameter Min Max Units Figure Notes
V
OS_MAX
Magnitude of V
CC
overshoot above VID — 65 mV 7-3 —
T
OS_MAX
Time duration of V
CC
overshoot above VccMAX
value at the new lighter load
—25ms 7-3 —
Figure 7-3. V
CC
Overshoot Example Waveform