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Toshiba Corporation Digital Media Network Company
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Self-test log data structure
Byte Descriptions
0-1 Self-test log data structure revision number
2-25 First descriptor entry
26-49 Second descriptor entry
..... ............
482-505 Twenty-first descriptor entry
506-507 Vendor specific
508 Self-test index
509-510 Reserved
511 Data structure checksum
11.8.42.6.4.1 Self-test log data structure revision number
The value of the self-test log data structure revision number is set to 0001h.
11.8.42.6.4.2 Self-test log descriptor entry
This log is viewed as a circular buffer. The first entry will begin at byte 2, the second entry will begin at byte 26,
and so on until the twenty-second entry, that will replace the first entry. Then, the twenty-third entry will replace
the second entry, and so on. If fewer than 21 self-tests have been performed by the device, the unused
descriptor entries will be filled with zeroes.
The content of the self-test descriptor entry is shown in the following Table.
Self-test log descriptor entry
Byte Descriptions
n Content of the Sector Number
n+1 Content of the self-test execution status
n+2 Life timestamp (least significant byte).
n+3 Life timestamp (most significant byte).
n+4 Content of the self-test failure checkpoint
n+5 Failing LBA(least significant byte).
n+6 Failing LBA(next least significant byte).
n+7 Failing LBA(next most significant byte).
n+8 Failing LBA(most significant byte).
n+9 - n+23 Vendor specific.
Content of the Sector Number register will be the content of the Sector Number register when the nth self-test
subcommand was issued.
Content of the self-test execution status byte will be the content of the self-test execution status byte when the
nth self-test was completed
Life timestamp will contain the power-on lifetime of the device in hours when the nth self-test subcommand was
completed.
Content of the self-test failure checkpoint byte will be the content of the self-test failure checkpoint byte when the
nth self-test was completed.
The failing LBA will be the LBA of the uncorrectable sector that caused the test to fail. If the device
encountered more than one uncorrectable sector during the test, this field will indicate the LBA of the
first uncorrectable sector encountered. If the test passed or the test failed for some reason other than an
uncorrectable sector, the value of this field is undefined.