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Life timestamp shall contain the power-on lifetime of the device in hours when the nth self-test subcommand
was completed.
Content of the self-test failure checkpoint byte may contain additional information about the self-test that failed.
The failing LBA shall be the LBA of the sector that caused the test to fail. If the device encountered more than
one failed sector during the test, this field shall indicate the LBA of the first failed sector encountered. If the test
passed or the test failed for some reason other than a failed sector, the value of this field is undefined.
11.8.43.3.4 Data structure checksum
The data structure checksum is the two's complement of the sum of the first 511 bytes in the data structure.
Each byte shall be added with unsigned arithmetic, and overflow shall be ignored. The sum of all 512 bytes is
zero when the checksum is correct. The checksum is placed in byte 511.
11.8.44 Write Log EXT (3Fh)
COMMAND CODE
0 0 1 1 1 1 1 1
REGISTER
REGISTER SETTING NORMAL COMPLETION
DR drive no. no change
LBA
Low
Current
Previous
log address
Reserved
HOB=0
HOB=1
Reserved
Reserved
LBA
Mid
Current
Previous
Sector offset(7:0)
Sector offset(15:8)
HOB=0
HOB=1
Reserved
Reserved
LBA
High
Current
Previous
Reserved
Reserved
HOB=0
HOB=1
Reserved
Reserved
SC Current
Previous
sector count(7:0)
sector count(15:8)
HOB=0
HOB=1
Reserved
Reserved
FT Current
Previous
Reserved
Reserved
HOB=0
HOB=1
no change
no change
This command writes a specified number of 512 byte data sectors to the specified log. The device shall
interrupt for each DRQ block transferred.
11.8.45 Device Configuration (B1h)
This command has a number of separate functions which can be selected via the Feature Register when the
command is issued. The subcommands and their respective codes are listed below.
Subcommand Feature Register
DEVICE CONFIGURATION RESTORE C0h
DEVICE CONFIGURATION FREEZE LOCK C1h
DEVICE CONFIGURATION IDENTIFY C2h
DEVICE CONFIGURATION SET C3h