Filter
Top Products
Chapter 11: DOS Diagnostics
122
data is correct. After the test, the program reads back data one more time
to insure the data stays correct. The test data used is 0x00000000,
0xFFFFFFFF, 0xAA55AA55, and 0x55AA55AA.
Address Test: Writes each address with unique increment data. Read
back data to insure data is correct. After fill the entire data with the unique
data, the program reads back data again to insure data stays the same.
WalkingOne bit Test: For each address, data one is written and read
back for testing. Then shift the data left one bit, so the data becomes two
and perform the same test again. It repeats for 32 times until the test bit is
shifted out of test data. The same is test is repeated for entire test range.
Pseudo Random Data Test: A pre-calculated pseudo random data is
used to write a unique data into each test RAM. After the first pass the
test, the program reads back one more time to insure data stays correct.
Default: Enabled
B2. BD SRAM Test
Function: This test tests the BD SRAM. This performs exact the same
way of testing as described in B1. Scratch Pad Test.
Default: Enabled
B3. DMA SRAM Test
Function: It tests DMA SRAM by performing the tests described in test
B1. The Scratch Pad Test.
Default: Enabled
B4. MBUF SRAM Test
Function: It tests DMA SRAM by performing the tests described in test
B1. The Scratch Pad Test.
Default: Enabled
B5. MBUF SRAM via DMA Test
Function: Eight test pattern data are used in the test. They are described
below. A 0x1000 sized data buffer is used for this test. Before each pattern
test, the buffer is initialized and filled with the test pattern. It then performs
size 0x1000 transmit DMA from host buffer to NIC MBUF memory. Verify
the data integrity in MBUF against host memory and repeat the DMA for
the entire MBUF buffer. Then it performs receive DMA from NIC to host.
The 0x1000-byte test buffer is cleared to zero before each receive-DMA.
Verify the data integrity and test is repeated for the entire MBUF SRAM
range. See Table 8 on page 123.