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AT-29xx Series Gigabit Ethernet Network Adapters Installation Guide
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Default: Enabled
B6. External SRAM Test
Function: It tests DMA SRAM by performing the tests described in test
B1. The Scratch Pad Test.
Default: Disabled
C1. EEPROM Test
Function: An increment test data is used in EEPROM test. It fills the test
data into the test range and read back to verity the content. After the test, it
fills data with zero to clear the memory.
Default: Enabled
C2. CPU Test
Function: This test opens the file cpu.bin. If file exists and content is good,
it loads code to rx and tx CPU and verifies CPU execution.
Default: Enabled
Table 8. DMA Test Patterns
Test Pattern Description
"16 00's 16 FF's" Full the entire host DMA buffer with 16
bytes of 00’s and then 16 bytes of FF’s.
"16 FF's 16 0's" Full the entire host DMA buffer with 16
bytes of FF’s and then 16 bytes of 00’s.
"32 00's 32 FF's" Full the entire host DMA buffer with 32
bytes of 00’s and then 32 bytes of FF’s.
"32 FF's 32 00's" Full the entire host DMA buffer with 32
bytes of FF’s and then 32 bytes of 00’s.
"00000000's" Full the entire host DMA buffer with all
zeros.
"FFFFFFFF's" Full the entire host DMA buffer with all
FF’s.
"AA55AA55's" Full the entire host DMA buffer with data
0xAA55AA55.
"55AA55AA's" Full the entire host DMA buffer with data
0xAA55AA55.