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ATLAS 550 System Manual Section 4, User Interface Guide
61200305L1-1F © 2002 ADTRAN, Inc. 97
The result of the self-test on each installed port is listed with Pass/Fail results. Figure 7 depicts a typical
test log. The fields included in the log are described below the figure.
Figure 7. View Selftest Log
The self-test log includes the following fields:
The tests associated with the system controller are shown in Table 2.
IDX
Index number of the log.
TIME
Time and date of the log entry.
SL
ATLAS 550 slot number.
PT
ATLAS 550 port number.
EVENT
Event description.
RESULT
Show PASS/FAIL results.
Table 2. ATLAS 550 System Controller Self-Test Log
T
HIS EVENT... LOGS THIS RESULT...
Flash Flash memory checksum verified
BootRom Boot ROM checksum verified
DSP RAM Memory associated with the Digital Signal Processor
RTC RAM Memory associated with the real time clock
NV Batt Tests the battery associated with non-volatile memory
TDM RAM Memory associated with mapping TDM bandwidth
DRAM Dynamic RAM used for program execution
HDLC The High-Level Data Link Controllers
Card Tst Tests the data path for each slot in the system with an installed module.