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Table of Contents
TDS 684A, TDS 744A, & TDS 784A Service Manual
iii
List of Figures
Figure 2–1: Map of Display Functions 2–8. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–1: Map of Display Functions 4–3. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–2: Verifying Adjustments and Signal-Path Compensation 4–6.
Figure 4–3: Universal Test Hookup for Functional Tests 4–8. . . . . . . . . .
Figure 4–4: Measurement of DC Offset Accuracy at Zero Setting 4–29. . .
Figure 4–5: Initial Test Hookup 4–30. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–6: Measurement of DC Accuracy at Maximum Offset
and Position 4–32. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–7: Initial Test Hookup 4–34. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–8: Measurement of Analog Bandwidth 4–36. . . . . . . . . . . . . . . . .
Figure 4–9: Initial Test Hookup 4–38. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–10: Measurement of Channel Delay – TDS 684A Shown 4–40. .
Figure 4–11: Initial Test Hookup 4–42. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–12: Measurement of Accuracy
— Long-Term and Delay Time 4–44. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–13: Initial Test Hookup 4–45. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–14: Measurement of Time Accuracy for Pulse and
Glitch Triggering 4–47. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–15: Initial Test Hookup 4–48. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–16: Measurement of Trigger-Level Accuracy 4–50. . . . . . . . . . . .
Figure 4–17: Initial Test Hookup 4–53. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–18: Measurement of Trigger Sensitivity
— 50 MHz Results Shown on a TDS 684A Screen 4–54. . . . . . . . . . . .
Figure 4–19: Initial Test Hookup 4–57. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–20: Measurement of Main Trigger Out Limits 4–59. . . . . . . . . . .
Figure 4–21: Initial Test Hookup 4–61. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–22: Measurement of Probe Compensator Frequency 4–62. . . . .
Figure 4–23: Subsequent Test Hookup 4–63. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–24: Measurement of Probe Compensator Amplitude 4–64. . . . .
Figure 4–25: Jitter Test Hookup 4–66. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–26: Jitter Test Displayed Waveform – TDS 684A Shown 4–67. .
Figure 4–27: Jitter Test When Completed – TDS 684A Shown 4–68. . . . .
Figure 4–28: Triggered Signal Range Test – 300 mV 4–70. . . . . . . . . . . . . .
Figure 4–29: Triggered Signal Range Test – 75 mV 4–71. . . . . . . . . . . . . . .
Figure 4–30: 60 Hz Rejection Test Hookup 4–72. . . . . . . . . . . . . . . . . . . . . .