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MaxLoader User’s Guide
117
device and may be free, inexpensive or expensive. The most popular
compiler is PALASM (prices under $200, available from AMD sales offices
and representatives), which supports most of AMD’s line of PLDs with an
easy-to-learn high-level language. The compiler that probably offers the
highest level of functionality and flexibility is PLDmaster made by Logical
Devices. It supports most PLDs and offers a sophisticated input language
with full support for state machines and other complex constructs,
partitioning designs into several PLDs, and graphical input. Their tools run
on PCs and workstations. PLD compilers have simulators that can be used to
test the functionality of your design and validate test vectors that you design
before programming a device.
PQFP Plastic Quad Flat Pack. See QFP.
QFP Quad Flat Pack. A square IC package that has surface-mount leads coming
from four sides. It is used for high-density applications, usually over 100
pins. Lead pitch may be 0.025 inches or smaller.
RAM Random Access Memory. A volatile memory device.
ROM Read Only Memory. A non-volatile memory device that cannot be
programmed by the user. It is programmed at the factory through the use of a
mask pattern in the final fabrication steps of the die.
Serial Memory An EPROM or EEPROM that is accessed by shifting in addresses and
shifting out data one bit at a time. Interfaces are available using one, two or
three wires for clock, data in, and data out.
Socket module An interchangeable metal chassis that contains a programming socket.
SOIC Small Outline Integrated Circuit. A surface-mount IC package that has two
rows of leads on opposite sides. Commonly found in 8 to 32 pin sizes. Leads
are usually 0.050 pitches.
Test vector A set of characters that describe the inputs and outputs of a device during a
functional test. There is one character in the vector for each pin on the device.
Numbers represent inputs to be applied to the device (1 for Vih, 0 for Vil).
Letters represent the outputs that must be tested (H for Voh, L for Vol, Z for
high-impedance). During the test, the part will be powered up and each input