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IXD1110 Demo Board
24 Development Kit Manual
Document Number: 250807
Revision Number: 003
Revision Date: June 27, 2003
8.6 Unused Test Points
The unused test points are for internal testing only and are not designed for evaluation of the
IXF1110 device. Table 11 provides a list of the unused test points.
Table 11. Unused Test Points
Test Points Description
J29
J29, J30, 31, J32, J33, J34, and TP1 are not
designated for IXF1110 evaluation
J30
J31
J32
J33
J34
TP1