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HP 8517B S-Parameter Test Set Manual
Index-1
A
abbreviations used in parts descriptions, 7-4
accessories descriptions, 2-3
active LED location, 3-1
adapter part numbers, 1-11
addressing a test set, 3-6
altering signal path conditions, 3-10
attaching anti-rotation clamps, 3-15
B
bias supply connector, 3-3
bias tees replacement, 6-11
bias tees usage, 1-2
block diagram, Option 004 HP 8517B, 1-3
block diagram, Option 007 HP 8517B, 1-3
block diagram, standard HP 8517B, 1-2
buffer amplifier replacement, 6-12
C
cable assemblies, flexible, 7-17
cable assemblies, semi-rigid, 7-16
cable descriptions and part numbers, 1-10
cabling the test set, 2-5
calibration cycle frequency, 1-6
calibration kit part number, 1-10
calibration procedure, 3-8
capacitor (filter capacitor) replacement, 6-6
CAUTION: CORRECTION MAY BE INVALID, 3-10
characteristics, 4-1, 4-2
characteristics of test set, 4-1
checking test set operation, 3-13
checking test-system operation, 1-5
checking test-system specifications, 1-5
choosing a test set from multiple test sets, 3-6
commands, switch driver, 3-6
configuration, 2-5
connection instructions, 2-6
connector-type descriptions, 2-6
D
definitions of prefixes used, 7-10
description of test set, 1-2
E
environmental requirements, 2-2
equipment requirements for replacing components, 6-3
ESD information, 6-1
ESD precaution, 1-13
F
fan assembly replacement, 6-8
features, front panel, 3-1
firmware compatibility matrix, 1-8
fixture kit part number, 1-11
frequency converter replacement, 6-5
front panel boards replacement, 6-10
front panel test ports, 4-1
front-panel parts ID, 7-19
fuse part numbers, 7-12
H
hardware stacking sequence, 7-23
high-power device measurement, 3-9
I
IF switching in the test set, 3-6
initializing a test set, 3-5
input amplifier replacement, 6-12
installing anti-rotation clamps, 3-15
J
J10 and J10 interconnect locations, 3-2
L
LED descriptions, 3-2
line module location, 3-2
M
manufacturer addresses (other than HP), 7-3
measurement accuracy maintenance, 1-6
measurement capabilities, 1-2
mechanical specifications, test set, 4-1
multiple test set configuration, 3-3, 3-7