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HP 8517B S-Parameter Test Set Manual
Getting Started
Test Set Description
Te st S et D es c ri pt io n
The HP 8517B test set configured with an HP 8510B/C network analyzer
and an HP 8360 series source, creates a system capable of making
S-parameter measurements from 45 MHz to 50 GHz. The system is
particularly suited for making two-port device measurements. You can
measure all four S-parameters without physically reversing the DUT (device
under test).
The system is also designed for making measurements on non-reciprocal
devices or components like transistors, amplifiers or isolators where S
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measurements are required.
Two directional couplers are used for signal separation. The configuration is
illustrated in the following figures:
• Figure 1-1, “Standard HP 8517B Test Set Block Diagram"
• Figure 1-2, “Option 004, HP 8517B Test Set Block Diagram"
• Figure 1-3, “Option 007, HP 8517B Test Set Block Diagram"
For active-device measurements, two bias tees apply external DC bias to
both test port center conductors.
Figure 1-1 Standard HP 8517B Test Set Block Diagram