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Flex-MuxOneNAND4G(KFM4GH6Q4M-DEBx)
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FLASH MEMORY
Flex-MuxOneNAND8G(KFN8GH6Q4M-DEBx)
Flex-MuxOneNAND16G(KFKAGH6Q4M-DEBx)
5.0 AC CHARACTERISTICS
5.1 AC Test Conditions
5.2 Device Capacitance
CAPACITANCE(TA = 25 C, VCC = 1.8V, f = 1.0MHz)
NOTE :
1) Capacitance is periodically sampled and not 100% tested.
5.3 Valid Block Characteristics
NOTE :
1) The device may include invalid blocks when first shipped. Additional invalid blocks may develop while being used. The number of valid blocks is presented with
both cases of invalid blocks considered. Invalid blocks are defined as blocks that contain five or more bad bits which cause status failure during Program and
Erase operation
. Do not erase or program factory-marked bad blocks.
2) The 1st block, which is placed on 00h block address, is guaranteed to be a valid block up to 1K program/erase cycles with 4bit/528Byte ECC.
Parameter Value (66MHz) Value (83MHz)
Input Pulse Levels 0V to V
CC 0V to VCC
Input Rise and Fall Times
CLK 3ns 2ns
other inputs 5ns 2ns
Input and Output Timing Levels
VCC/2 VCC/2
Output Load
CL = 30pF CL = 30pF
Item Symbol Test Condition
Single DDP QDP Unit
Min Max Min Max Min Max
Input Capacitance CIN1 VIN=0V - 10 - 20 - 40
pF
Control Pin Capacitance C
IN2
VIN=0V
-10-20-40
Output Capacitance C
OUT VOUT=0V - 10 - 20 - 40
INT Capacitance C
INT VOUT=0V - 10 - 20 - 40
Parameter Symbol Min Typ. Max Unit
Valid Block Number
Single
N
VB
998 - 1024
BlocksDDP 1996 - 2048
QDP 3993 - 4096
0V
V
CC
VCC/2
V
CC/2
Input Pulse and Test Point
Input & Output
Test Point
Output Load
Device
Under
Test
* CL = 30pF including scope
and Jig capacitance