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VX1410A & VX1420A IntelliFrame Mainframe Instruction Manual
3–149
TEST Subsystem
This section describes each command and query in the TEST subsystem. These
commands are used to execute internal self tests. The TEST subsystem controls
the parameters shown in Figure 3–9.
TEST
ALL? NUMBer
RESults
Figure 3–9: TEST subsystem hierarchy
Table 3–19 lists all of the internal self tests of the IntelliFrame Mainframe.
Table 3–19: IntelliFrame Mainframeself test
Test number Test name
Execution time
(seconds)
Power on test
Included in
TEST?
Invoked by
TEST:NUMBer?
1000 Fan Speed Control 116 No Yes Yes
1010 ADC and DAC Control < 1 Yes Yes Yes
1100 Front Panel Display Control Test 1 25 No No Yes
1110 Front Panel Display Control Test 2 36 No No Yes
1120 Front Panel Display Control Test 3 6 No No Yes
A description of each self test is listed below:
H Fan Speed Control test. This test varies the fan speed control and verifies
that the fan speed changes accordingly.
H ADC and DAC Control test. This test verifies the internal ADC and DAC
circuitry.
H Front Panel Display Control Test 1. This test performs the following
sequences:
a. Turns on all display pixels.
b. Turns off all display pixels.
c. Writes the character 8 to each display position.
d. Turns on all display pixels.