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3
To perform the self-tests 3-3
To make the test connectors 3-6
To test the threshold accuracy 3-8
To test the glitch capture 3-17
To test the single-clock, single-edge, state acquisition 3-23
To test the multiple-clock, multiple-edge, state acquisition 3-34
To test the single-clock, multiple-edge, state acquisition 3-45
To test the time interval accuracy 3-54
Performance Test Record 3-59
Testing Performance