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Performance Test Record
Performance Test Record
1664A Logic Analyzer_______
Serial No.______________________ Work Order No.___________________
Recommended Test Interval - 2 Year/4000 hours Date___________________
Recommended next testing___________________ Temperature___________________
Test Settings Results
Self-Tests
Pass/Fail ________
Threshold
Accuracy
± (100 mV + 3% of
threshold setting)
Limits Measured
Pod 1
TTL, ±145 mV
ECL, ±139 mV
-User, ±280 mV
+User, ±280 mV
0 V, ±100 mV
TTL VL
TTL VH
ECL VL
ECL VH
-User VL
- User VH
+ User VL
+ User VH
0 V User VL
0 V User VH
+1.355 V
+1.645 V
-1.439 V
-1.161 V
-6.280 V
-5.720 V
+5.720 V
+6.280 V
-100 mV
+100 mV
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________
Pod 2
TTL, ±145 mV
ECL, ±139 mV
-User, ±280 mV
+User, ±280 mV
0 V, ±100 mV
TTL VL
TTL VH
ECL VL
ECL VH
-User VL
- User VH
+ User VL
+ User VH
0 V User VL
0 V User VH
+1.355 V
+1.645 V
-1.439 V
-1.161 V
-6.280 V
-5.720 V
+5.720 V
+6.280 V
-100 mV
+100 mV
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Glitch Capture
Minimum Detectable
Glitch 3.5 ns
Pass/Fail
Pod 1 ________
Pod 2 ________
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