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Exatron 3000B
www.exatron.com 3-4 Chapter 3 Interface Info
Handler Binning Setup
I.Introduction:
E
XATRON
handlers are designed to accept as many as eight sort messages from your tester/programmer
equipment. Selecting which output bins the handler will then put your devices in is accomplished by
programming the handler to match physical output bins to tester sort results. The tester sort signals will
come into the handler via the Parallel Port or the RS232 Port. Please refer to the Interface Information
chapter of this manual for further reference on tester-handler communication.
II. Designing Bin Assignments:
A. Pass, Retest, Fail
Typically, there are three main categories of test results: devices that pass
test, devices that definitely
fail
test, and devices that may or may not have failed. This last category is best understood as continuity
errors, missed contacts, devices in test during power outages, etc. These are devices which may in fact
be good devices but which need to be retested.
If the test program in use is designed to differentiate between fail and retest devices, then E
XATRON
recommends bin 5 as the retest bin. Assign bins 4 and/or 6 as the positive fail bins in this situation.
Where no differentiation is made between fail and retest devices, then assign bin 5 for these devices.
B. Positive Binning
Positive binning is the concept of designing the bin assignments to minimize the ill effects of accidental
binning errors. All E
XATRON
handlers have very substantial mis-binning protection built in. It is impossible
to say absolutely that no mis-bins will ever occur. As a defense against accidental mis-binning, it is
generally considered bad practice to carry “fail” or “retest” devices to their bins over the tops of any good
device bin. It is better to accidentally drop a good device in a fail bin than to accidentally drop a failed
device in a good bin.
Looking at the above diagram, it would be inappropriate to put anything but “retest” or “fail” devices in bin
5. If bin 5 is assigned as a good bin, then some other bin must be assigned as a fail bin. It would then be
necessary to carry a failed device across the good bin 5 to some other location. This is not recommended.
If your test results provide for grades, then the best grades should be in the outside bins, with lower
grades toward the inside. If a highest-rated device is accidentally dropped in a lower-grade bin, that is not
as bad a problem as if a lower grade device is dropped in a higher-grade bin.
C. Unused Sort Signals
It is wise to always assign the “retest” tube as the output for unused sort signals. This acts as a defense
against “ghost” signals which may occur as a result of tester interface “noise” or power fluctuations.
III. Finding Bin Assignment Data:
To figure out the correct binning data for your desired tube outputs, please consult the
“ Test Signal
- Bin Sort Data Worksheet”
which accompanies this document.
1 2 3 4 5 6
78
Output from
handler
Shuttle, moves over
Bins
Outside - Inside
-
Outside