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Monitor: Power-up Diagnostic/Test Commands
10002367-02 PmT1 and PmE1 User’s Manual
8-17
POWER-UP DIAGNOSTIC/TEST COMMANDS
The following on-card functional tests are available to be run at any time, including power-
up and reset. The nonvolatile configuration memory can be used to enable or disable the
execution of these tests on power-up and reset (see the nvdisplay command’s Misc group
in
Tab le 8 -1 ).
The results of the tests are stored at an offset of 0x60 in the I
2
C EEPROM. To read the
PASS/FAIL flags, do four byte reads from the EEPROM at 0x60, 0x61, 0x62, and 0x63. The
byte at 0x60 should contain the magic number 0xa5 indicating that the device is functional
and that PASS/FAIL reporting is supported. The values for the long word when a failure
occurs are listed in
Ta ble 8 -3 .
Table 8-3: NVRAM Power-up Diagnostic PASS/FAIL Flags
The power-up PASS/FAIL flags are also written to PLX Mailbox 0. The module writes the
progress and PASS/FAIL status of each of its power-up tests to PCI so that the baseboard
can determine the power-up status of the module and proceed accordingly. At the conclu-
sion of power-up, the same magic number (0xa5) used in the NVRAM PASS/FAIL flags is
written to the least significant bit (LSB) of PLX Mailbox 0. The PLX Mailbox 0 register can be
polled until the magic number is displayed and then checked to see if there are any fail
mask bits set. The following bits in
Tab le 8 -4 are used to indicate the power-up test
sequence and failure.
Table 8-4: PLX Mailbox 0 Sequence and Fail Mask Bits
For example, if the module had a memory failure, the PLX Mailbox 0 register would contain
0x0B000400. For parity and DRAM failures, the same register would contain 0x0A000600.
The magic number 0xa5 will not be in the LSB of the PLX Mailbox 0 register because if a
memory error is encountered, then the debug monitor is entered. If all power-up tests
pass, the PLX Mailbox 0 will be 0xA5000000.
Test: Value Read on Failure:
Serial 0xa5000001
Counter/Timer 0xa5000002
Cache 0xa5000010
EEPROM 0xa5000020
Power-up Test: Sequence Bit: Fail Mask Bit:
Counter/Timer 0x02000000 0x00000002
Cache 0x05000000 0x00000010
EEPROM 0x06000000 0x00000020
Parity DRAM Memory 0x0A000000 0x00000200
Data DRAM Memory 0x0B000000 0x00000400