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R61509V Target Spec
Rev. 0.11 April 25, 2008, page 18 of 181
Table 9 Others (test, dummy pins)
Signal I/O Connect to Function
When not in
use
VTEST O Open Test pin. Leave open. Open
VREFC I GND Test pin. Make sure to fix to the GND level. -
VREFD O Open Test pin. Leave open. Open
VREF O Open Test pin. Leave open. Open
VDDTEST I GND Test pin. Make sure to fix to the GND level. -
VMON O Open Test pin. Leave open. Open
VCIR O Open Test pin. Leave open. Open
GNDDUM1-
10,
AGNDDUM1
-5,
VCCDUM,
IOVCCDUM
1-2
O - Pins to fix the electrical potentials of unused interface and test pins.
Open
DUMMYR
1-4
- - DUMMYR1 and DUMMYR4, DUMMYR2 and DUMMYR3 are short-
circuited within the chip for COG contact resistance measurement.
Open
VGLDMY
1-4
O Unused
gate line
Output VGL level. Use when fixing unused gate line of the panel. Open
DUMMYA ― Open Dummy pad. Leave open. OPEN
DUMMYB ― Open Dummy pad. Leave open. OPEN
DUMMYC ― Open Dummy pad. Leave open. OPEN
TESTO1-15 O ― Dummy pad. Leave open. OPEN
TEST
1-5
I GND Test pin. Connect to GND. GND
TS0-8 O Open Test pin. Leave open. OPEN
VPP3B I AGND Test pin. Connect to AGND. ―
TSC I GND Test pin. Connect to GND.
GND
Patents of dummy pin, which is used to fix to VCC or GND are granted.
PATENT ISSUED:
United States Patent No. 6,924,868
United States Patent No. 6,323,930
Japanese Patent No. 3,980,066
Korean Patent No. 401,270
Taiwanese Patent No. 175,413