LSI 53C875A Computer Hardware User Manual


 
6-6 Electrical Specifications
Table 6.11 TolerANT Technology Electrical Characteristics for SE SCSI Signals
Symbol Parameter Min
1
1. These values are guaranteed by periodic characterization; they are not 100% tested on every
device.
Max Unit Test Conditions
V
OH
2
2. Active negation outputs only: Data, Parity, SREQ/, SACK/.
Output high voltage 2.0 V
DD
+0.3 V I
OH
=7mA
V
OL
Output low voltage V
SS
0.5 V I
OL
=48mA
V
IH
Input high voltage 2.0 V
DD
+0.3 V
V
IL
Input low voltage V
SS
0.3 0.8 V Referenced to V
SS
V
IK
Input clamp voltage 0.66 0.77 V V
DD
=4.75;I
I
= 20 mA
V
TH
Threshold, HIGH to LOW 1.0 1.2 V
V
TL
Threshold, LOW to HIGH 1.4 1.6 V
V
TH
–V
TL
Hysteresis 300 500 mV
I
OH
2
Output high current 2.5 24 mA V
OH
=2.5V
I
OL
Output low current 100 200 mA V
OL
=0.5V
I
OSH
2
Short-circuit output high current 625 mA Output driving low, pin
shorted to V
DD
supply
3
3. Single pin only; irreversible damage may occur if sustained for one second.
I
OSL
Short-circuit output low current 95 mA Output driving high, pin
shorted to V
SS
supply
I
LH
Input high leakage 20 µA 0.5 < V
DD
<5.25
V
PIN
=2.7V
I
LL
Input low leakage 20 µA 0.5 < V
DD
<5.25
V
PIN
=0.5V
R
I
Input resistance 20 M SCSI pins
C
P
Capacitance per pin 15 pF PQFP
t
R
2
Rise time, 10% to 90% 4.0 18.5 ns Figure 6.1
t
F
Fall time, 90% to 10% 4.0 18.5 ns Figure 6.1
dV
H
/dt Slew rate, LOW to HIGH 0.15 0.50 V/ns Figure 6.1
dV
L
/dt Slew rate, HIGH to LOW 0.15 0.50 V/ns Figure 6.1
ESD Electrostatic discharge 2 KV MIL-STD-883C; 3015-7
Latch-up 100 mA
Filter delay 20 30 ns Figure 6.2
Ultra filter delay 10 15 ns Figure 6.2
Extended filter delay 40 60 ns Figure 6.2