Command Dictionary Set Drc Handling
FastScan and FlexTest Reference Manual, V8.6_4
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Set Drc Handling
Tools Supported: FastScan and FlexTest
Scope: All modes
Usage
SET DRc Handling drc_id [Error | Warning | NOTe | Ignore] [
NOVerbose |
Verbose] [
NOAtpg_analysis | Atpg_analysis] [-Mode A clk_name] [-Interval
number] [ATPGC] [-Mode {Sequential | Combinational}]
Description
Specifies how the tool globally handles design rule violations.
The Set Drc Handling command specifies the handling of the messages for the
scan cell RAM rules checking, Clock rules checking, Data rules checking, Extra
rules checking, and Trace rules checking. You can specify that the violation
messages for these checks be either error, warning, note, or ignore. If you do not
specify error, warning, note, or ignore, then the tool uses either the handling from
the last Set Drc Handling command or, if you did not change the handling, the
Design Rules Checker‘s invocation default.
Each rules violation has an associated occurrence message and summary message.
The tool only displays the occurrence message for either error conditions or if you
specify the Verbose option for that rule. The tool displays the rule identification
number in all rules violation messages.
The Atpg_analysis option provides test generation analysis when performing rules
checking for some clock (C) rules, for some data (D) rules, and for some extra (E)
rules. For example, if you specify Atpg_analysis for clock rule C1 and the tool
simulates a clock input as X, the rule violation occurs when it is possible for the
test generator to create a test pattern while that clock input is on, all defined clocks
are off and all constrained pins are at their constrained state.
Note
When you specify Atpg_analysis, the tool requires some
additional CPU time and memory to perform the test generation
analysis.