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FastScan and FlexTest Reference Manual, V8.6_4
4-8
FastScan Test Pattern File Format Test Pattern File Formats
Scan_Test
The scan_test section contains the definition of the scan test patterns that were
created by the FastScan program. A scan pattern will normally include the
following:
SCAN_TEST =
PATTERN = <number>;
FORCE “PI” “primary_input_values” <time>;
APPLY “scan_group_load_name” <time> =
CHAIN “scan_chain_name1” = “values....”;
CHAIN “scan_chain_name2” = “values....”;
....
....
END;
FORCE “PI” “primary_input_values” <time>;
MEASURE “PO” “primary_output_values” <time>;
PULSE “capture_clock_name1” <time>;
PULSE “capture_clock_name2” <time>;
APPLY “scan_group_unload_name” <time> =
CHAIN “scan_chain_name1” = “values....”;
CHAIN “scan_chain_name2” = “values....”;
....
....
END;
....
....
....
END;
The number of the pattern represents the pattern number in which the scan chain is
loaded, values are placed and measured, any capture clock is pulsed, and the scan
chain is unloaded. The pattern number is zero-based and must start with zero. An
additional force statement will be applied at the beginning of each test pattern, if
transition faults are used. The scan group load and unload names and the scan
chain names will be enclosed by double quotes. All the time values for a pattern
must not be lower than the previous time values in that pattern. The values to load
and unload the scan chain will be enclosed in double quotes. Refer to the
Functional_Chain_Test section on how the loading and unloading of the scan
chain operates.