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FastScan and FlexTest Reference Manual, V8.6_4
4-18
FlexTest Test Pattern File Format Test Pattern File Formats
An event in a normal test cycle can be a force event, or measure event. All events
have to have correct timing order, as defined by the Add Pin Constraints and Add
Pin Strobes commands.
The format of a force event is as follows.
FORCE “ibus_name” “primary_input_values” <time>;
A force event is used to force values on the selected primary input pins at the
given time unit within the specified test cycle. The name is either a primary input
name or a input bus name defined in Setup_Data part, and is enclosed in double
quotes. The values will also be enclosed in double quotes. If a bus name is used,
the values will be in a one-to-one correspondence with the order of the specified
primary inputs in Setup_Data part.
The format of a measure event is as follows.
MEASURE “obus_name” “primary_output_values” <time>;
A measure event is used to measure the value of the selected primary output pins
at the given time unit within the specified test cycle. The name is either a primary
output name or an output bus name defined in Setup_Data part, and is enclosed in
double quotes. The values will also be enclosed in double quotes. If a bus name is
used, the values will be in a one-to-one correspondence with the order of the
specified primary outputs in Setup_Data part.
If the test set contains patterns for IDDQ testing, an additional measure event will
be listed for IDDQ patterns. The format of the IDDQ measure event is as follows.
MEASURE IDDQ ALL <time>:
Scan_Cell
The scan_cell section contains the definition of the scan cells used in the circuit.
The scan cell data will be in the following format:
SCAN_CELLS =
SCAN_GROUP “group_name1” =
SCAN_CHAIN “chain_name1” =
SCAN_CELL = <cellid> <type> <sciinv> <scoinv> <relsciinv>