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FastScan and FlexTest Reference Manual, V8.6_4
2-524
Set Loop Handling Command Dictionary
Set Loop Handling
Tools Supported: FastScan and FlexTest
Scope: Setup mode
Usage
For FastScan
SET LOop Handling {Tiex [-Duplication {ON | OFf}]} | {Simulation
[-Iterations n]}
For FlexTest
SET LOop Handling {{Tiex | Delay} [-Duplication {ON | OFf}]} | Simulation
Description
Specifies how the tool handles feedback networks.
The Set Loop Handling command allows you to perform DRC simulation of
circuits containing combinational feedback networks.
FastScan Specifics
The Set Loop Handling command specifies FastScan loop handling behavior by
either inserting a TIE-X gate or by stabilizing the loop values through an iterative
simulation process.
By using the -Tiex setting, you have the option to use gate duplication to reduce
the impact that a TIE-X gate places on the circuit to break combinational loops.
By default, this duplication switch is off.
The Simulation option allows you to enter the number of iterations used to
stabilize the circuit. However, excessive values will have an impact on both
performance and memory usage.
FlexTest Specifics
The Set Loop Handling command specifies FlexTest loop handling behavior by
either 1) using a TIE-X gate to break the loop, or 2) inserting a delay element to
break the loop, or 3) using a simulation process to identify the loop behavior.