Mentor v8.6_4 All in One Printer User Manual


 
FastScan and FlexTest Reference Manual, V8.6_4
A-54
SET SPLIT_BIDI_CYCLE TIME Timing Command Dictionary
SET SPLIT_BIDI_CYCLE TIME
Scope: Enables special timing rules checking
Usage
SET SPLIT_BIDI_CYCLE TIME integer
Description
Specifies the period for test procedures and splits the non-scan cycle before the
force or bidi_force time.
Certain testers formats, such as UTIC and Compass Scan, do not allow state
changes on both input pins and bidirectional pins in a single tester cycle. In this
case, you must split each non-scan cycle into two tester cycles. The SET
SPLIT_BIDI_CYCLE TIME command enables the ASICVector Interfaces (AVI)
functionality to split the non-scan test cycle into two tester cycles when writing
patterns.
If you place this command in the timing file, the timing rules checker ensures
compliance to the following conditions:
The period of all pins is twice that of the split_bidi_cycle time.
The period of all scan test procedures equals the split_bidi_cycle time
multiplied by the number of cycles in the test procedure.
The timing file contains the SET BIDI_FORCE TIME command to specify
bidirectional pin force times.
All bidirectional pins have the same offset time.
The split_bidi_cycle time is greater than the force time and less than or
equal to the bidirectional force time for each bidirectional pin.
For each scan test procedure, each force event time on a clock pin
corresponds to the pair of force times specified in the timing file.
For each scan test procedure, each force event on a non-clock pin
corresponds to the force time specified in the timing file.